Advances in High Resolution Helium Ion Microscope (HIM) Imaging
نویسندگان
چکیده
منابع مشابه
Helium Ion Microscopy (HIM) for the imaging of biological samples at sub-nanometer resolution
Scanning Electron Microscopy (SEM) has long been the standard in imaging the sub-micrometer surface ultrastructure of both hard and soft materials. In the case of biological samples, it has provided great insights into their physical architecture. However, three of the fundamental challenges in the SEM imaging of soft materials are that of limited imaging resolution at high magnification, charg...
متن کاملRecovery of Background Structures in Nanoscale Helium Ion Microscope Imaging
This paper discusses a two step enhancement technique applicable to noisy Helium Ion Microscope images in which background structures are not easily discernible due to a weak signal. The method is based on a preliminary adaptive histogram equalization, followed by 'slow motion' low-exponent Lévy fractional diffusion smoothing. This combined approach is unexpectedly effective, resulting in a com...
متن کاملSecondary Electron Imaging in the Helium Ion Microscope
Secondary electrons (SE) have been for many years the most user friendly, versatile, and convenient modes of imaging in the scanning electron microscope. The Helium Ion Microscope (HIM) also generates secondary electrons (iSE) and potentially offers significant advantages compared to the conventional SEM including much enhanced spatial resolution and improved image contrast. There are, however,...
متن کاملScanning reflection ion microscopy in a helium ion microscope
Reflection ion microscopy (RIM) is a technique that uses a low angle of incidence and scattered ions to form an image of the specimen surface. This paper reports on the development of the instrumentation and the analysis of the capabilities and limitations of the scanning RIM in a helium ion microscope (HIM). The reflected ions were detected by their "conversion" to secondary electrons on a pla...
متن کاملNanofabrication with a Helium Ion Microscope
The recently introduced helium ion microscope (HIM) is capable of imaging and fabrication of nanostructures thanks to its sub-nanometer sized ion probe [1,2]. The unique interaction of the helium ions with the sample material provides very localized secondary electron emission, thus providing a valuable signal for high-resolution imaging as well as a mechanism for very precise nanofabrication [...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2009
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927609094331